In situ X-ray diffraction studies of the piezoelectric behavior of PZT thin films - Aix-Marseille Université Access content directly
Conference Papers Year : 2016
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hal-01453244 , version 1 (02-02-2017)

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  • HAL Id : hal-01453244 , version 1

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T.W. Cornelius, C. Mocuta, S. Escoubas, E.C. Lima, E.B. Araujo, et al.. In situ X-ray diffraction studies of the piezoelectric behavior of PZT thin films. Meeting of the French Crystallography Association (AFC 2016), Jul 2016, Marseille, France. ⟨hal-01453244⟩
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