Conference Papers
Year : 2016
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https://amu.hal.science/hal-01455417
Submitted on : Friday, February 3, 2017-3:13:11 PM
Last modification on : Tuesday, December 5, 2023-6:08:07 PM
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- HAL Id : hal-01455417 , version 1
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N. Andrianjohany, P. Pourrouquet, K. Castellani-Coulié, N. Chatry, W. Rahajandraibe, et al.. Prediction methodology of Single Event Effect Sensitivity and application on SRAM device. RADECS, Sep 2016, Bremen, Germany. ⟨hal-01455417⟩
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