Resistive RAM Variability Monitoring using a Ring Oscillator based Test Chip - Aix-Marseille Université Access content directly
Conference Papers Year : 2016
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hal-01463136 , version 1 (09-02-2017)

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  • HAL Id : hal-01463136 , version 1

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Hassen Aziza, Jean-Michel Portal. Resistive RAM Variability Monitoring using a Ring Oscillator based Test Chip. 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2016), Sep 2016, Halle, Germany. ⟨hal-01463136⟩
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