Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films - Aix-Marseille Université
Journal Articles Defect and Diffusion Forum Year : 2011
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hal-02394011 , version 1 (04-12-2019)

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Alain Portavoce, Ivan Blum, Lee Chow, Jean Bernardini, Dominique Mangelinck. Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films. Defect and Diffusion Forum, 2011, 309-310, pp.63-72. ⟨10.4028/www.scientific.net/DDF.309-310.63⟩. ⟨hal-02394011⟩
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