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Journal Articles Condensed Matter Physics Year : 2016

Effect of film thickness on the width of percolation threshold in metal-dielectric composites

M. Mokhtari
  • Function : Author
L. Zekri
  • Function : Author
Nouredine Zekri

Abstract

The effect of thickness on the width of the percolation threshold in metal-dielectric composite films was examined. The distribution of current intensities through cubic networks of metal and dielectric components was determined using Kirchhoff's equations. From the tail of current distribution, the width of the percolation threshold was defined using Lévy statistics, and determined as a function of the film thickness for a system size 100. In the 2D-3D crossover region, the percolation width decreases as a power-law with a power exponent of 0.36±0.01.

Dates and versions

hal-03560809 , version 1 (07-02-2022)

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M. Mokhtari, L. Zekri, Ahmed Kaiss, Nouredine Zekri. Effect of film thickness on the width of percolation threshold in metal-dielectric composites. Condensed Matter Physics, 2016, 19 (4), pp.43001. ⟨10.5488/CMP.19.43001⟩. ⟨hal-03560809⟩
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