This review paper aims to provide a survey of modeling and simulation of single-event effects (SEEs) in digital electronics at device, circuit and system levels. It primarily focuses on the specific multi-scale, multi-physics, multi-domain nature of SEEs and on the main underlying physical mechanisms that lead to the occurrence of single events in digital devices and circuits. This review addresses the different ways to model and simulate both in space and time this complex sequence of mechanisms from the particle-material interaction up to the electrical response of a given electronics device, circuit, or system. It highlights the specific features of each methodology, and discusses simulation requirements, code or model inputs and expected outputs.