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Communication Dans Un Congrès Année : 2014

Particle Monte Carlo Modeling of Single-Event Transient Current and Charge Collection in Integrated Circuits

Résumé

This work describes a new computational approach for modeling the radiation-induced transient current and charge collection at circuit-level. Our methodology is based on a random-walk process that takes into account both diffusion and drift of radiation-induced minority carriers in a non-constant electric field both in space and time. The model has been successfully coupled either with an internal routine or with SPICE for circuit solving and feedback on the charge-collection process. It is illustrated here for a junction impacted by an ionizing particle and embedded in a CMOS inverter.
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Dates et versions

hal-04373126 , version 1 (04-01-2024)

Identifiants

  • HAL Id : hal-04373126 , version 1

Citer

Jean-Luc Autran, Maximilien Glorieux, Daniela Munteanu, Sylvain Clerc, Gilles Gasiot, et al.. Particle Monte Carlo Modeling of Single-Event Transient Current and Charge Collection in Integrated Circuits. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014), Sep 2014, Berlin, Germany. ⟨hal-04373126⟩
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