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Communication Dans Un Congrès Année : 2012

Soft-Error Rate Induced by Thermal and Low Energy Neutrons in 40 nm SRAMs

Résumé

The interactions of thermal and low energy (<1 MeV) atmospheric neutrons with natural boron-doped silicon is investigated using Geant4. Consequences on the soft-error rate at ground level are analyzed and quantified for 40nm SRAMs.
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Dates et versions

hal-04376248 , version 1 (06-01-2024)

Identifiants

  • HAL Id : hal-04376248 , version 1

Citer

Jean-Luc Autran, Sébastien Serre, Serguei Semikh, Daniela Munteanu, Gilles Gasiot, et al.. Soft-Error Rate Induced by Thermal and Low Energy Neutrons in 40 nm SRAMs. IEEE Nuclear and Space Radiation Effects Conference (NSREC 2012), Jul 2012, Miami (FL), United States. ⟨hal-04376248⟩
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