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authFullName_s : N. Burle

Relaxation of low mismatched semiconducting layers by misfit dislocations : models and observations

B. Pichaud , Magali Putero , N. Burle
Journal de Physique IV Proceedings, 1998, 08 (PR4), pp.Pr4-227-Pr4-236. ⟨10.1051/jp4:1998428⟩
Journal articles hal-01951287v1

In-situ combined X-Ray diffraction and optical curvature measurements to study microstructure and stress induced during the crystallization of GeTe thin films

M. Gallard , M.S. Amara , F. Lauraux , C. Guichet , M.-I. Richard , et al.
MAM2017 – Materials for Advanced Metallization Conference, Mar 2017, Dresden, Germany
Conference papers hal-01781799v1

Tungsten diffusion in silicon

A. de Luca , A. Portavoce , M. Texier , C. Grosjean , N. Burle , et al.
Journal of Applied Physics, 2014, 115 (1), pp.013501. ⟨10.1063/1.4859455⟩
Journal articles hal-02385347v1

Study of the microstructure and stress induced during the crystallization of GeTe thin films

M. Gallard , M.S. Amara , F. Lauraux , C. Guichet , S. Escoubas , et al.
E/PCOS 2017, European Phase Change and Ovonics Symposium, Sep 2017, Aachen, Germany
Conference papers hal-01781812v1

In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization

B. Ben Yahia , M.S. Amara , M. Gallard , N. Burle , S. Escoubas , et al.
Micro and Nano Engineering, 2018, ⟨10.1016/j.mne.2018.10.001⟩
Journal articles hal-01951257v1
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Dynamic segregation of metallic impurities at SiO 2 /Si interfaces

A. de Luca , A. Portavoce , M. Texier , N. Burle , B Pichaud
Journal of Physics: Conference Series, 2013, 471, pp.012029. ⟨10.1088/1742-6596/471/1/012029⟩
Journal articles hal-02111770v1

Structure et propagation de défauts dans les nanopiliers de silicium

A. Merabet , M. Texier , C. Tromas , M. Verdier , A. Talneau , et al.
Congrés de l’Association Française de Cristallographie, Jul 2016, Marseille, France
Conference papers hal-01453348v1

Metastability in the Matthews- Blakeslee mechanism for semiconductor film relaxation

Magali Putero , N. Burle , B. Pichaud
Philosophical Magazine Letters, 2001, 81 (8), pp.519-525. ⟨10.1080/09500830110059829⟩
Journal articles hal-01951280v1

Low misfit systems as tools for understanding dislocation relaxation mechanisms in semiconducting heteroepitaxial films

B. Pichaud , N. Burle , Magali Putero , C. Curtil
Journal of Physics: Condensed Matter, 2002, 14 (48), pp.13255-13267. ⟨10.1088/0953-8984/14/48/376⟩
Journal articles hal-01951277v1

Dynamic segregation of metallic impurities at SiO 2 /Si interfaces

A. de Luca , A. Portavoce , M. Texier , N. Burle , B Pichaud
Journal of Physics: Conference Series, 2013, 471, pp.012029. ⟨10.1088/1742-6596/471/1/012029⟩
Journal articles hal-02385357v1