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Relaxation of low mismatched semiconducting layers by misfit dislocations : models and observations
B. Pichaud
,
Magali Putero
,
N. Burle
Journal articles
hal-01951287v1
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In-situ combined X-Ray diffraction and optical curvature measurements to study microstructure and stress induced during the crystallization of GeTe thin films
M. Gallard
,
M.S. Amara
,
F. Lauraux
,
C. Guichet
,
M.-I. Richard
,
et al.
MAM2017 – Materials for Advanced Metallization Conference, Mar 2017, Dresden, Germany
Conference papers
hal-01781799v1
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Tungsten diffusion in silicon
A. de Luca
,
A. Portavoce
,
M. Texier
,
C. Grosjean
,
N. Burle
,
et al.
Journal articles
hal-02385347v1
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Study of the microstructure and stress induced during the crystallization of GeTe thin films
M. Gallard
,
M.S. Amara
,
F. Lauraux
,
C. Guichet
,
S. Escoubas
,
et al.
E/PCOS 2017, European Phase Change and Ovonics Symposium, Sep 2017, Aachen, Germany
Conference papers
hal-01781812v1
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In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization
B. Ben Yahia
,
M.S. Amara
,
M. Gallard
,
N. Burle
,
S. Escoubas
,
et al.
Journal articles
hal-01951257v1
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Dynamic segregation of metallic impurities at SiO 2 /Si interfaces
A. de Luca
,
A. Portavoce
,
M. Texier
,
N. Burle
,
B Pichaud
Journal articles
hal-02111770v1
|
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Structure et propagation de défauts dans les nanopiliers de silicium
A. Merabet
,
M. Texier
,
C. Tromas
,
M. Verdier
,
A. Talneau
,
et al.
Congrés de l’Association Française de Cristallographie, Jul 2016, Marseille, France
Conference papers
hal-01453348v1
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Metastability in the Matthews- Blakeslee mechanism for semiconductor film relaxation
Magali Putero
,
N. Burle
,
B. Pichaud
Journal articles
hal-01951280v1
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Low misfit systems as tools for understanding dislocation relaxation mechanisms in semiconducting heteroepitaxial films
B. Pichaud
,
N. Burle
,
Magali Putero
,
C. Curtil
Journal articles
hal-01951277v1
|
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Dynamic segregation of metallic impurities at SiO 2 /Si interfaces
A. de Luca
,
A. Portavoce
,
M. Texier
,
N. Burle
,
B Pichaud
Journal articles
hal-02385357v1
|
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