Conference Papers
Year : 2016
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https://amu.hal.science/hal-01437034
Submitted on : Monday, January 16, 2017-9:41:26 PM
Last modification on : Monday, June 10, 2024-4:58:03 PM
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- HAL Id : hal-01437034 , version 1
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P. Chiquet, J. Postel-Pellerin, C. Tuninetti, S. Souiki-Figuigui, P. Masson. Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices. Workshop on New Perspectives in Measurements, Tools and Techniques for system’s reliability, maintainability and safety, Jun 2016, Milan, Italy. ⟨hal-01437034⟩
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