Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices - Aix-Marseille Université Access content directly
Conference Papers Year : 2016
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hal-01437034 , version 1 (16-01-2017)

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  • HAL Id : hal-01437034 , version 1

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P. Chiquet, J. Postel-Pellerin, C. Tuninetti, S. Souiki-Figuigui, P. Masson. Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices. Workshop on New Perspectives in Measurements, Tools and Techniques for system’s reliability, maintainability and safety, Jun 2016, Milan, Italy. ⟨hal-01437034⟩
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