In situ Synchrotron X-ray Imaging of Extended Defects Generation and Evolution during Monocrystalline Si Seeded Growth

M.G. Tsoutsouva; T. Riberi-Béridot; G. Reinhart; G. Regula; Nathalie Mangelinck-Noël

Conference Papers Year : 2016

In situ Synchrotron X-ray Imaging of Extended Defects Generation and Evolution during Monocrystalline Si Seeded Growth

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1

M.G. Tsoutsouva

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

T. Riberi-Béridot

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

G. Reinhart

Function : Author
PersonId : 18167
IdHAL : guillaume-reinhart
ORCID : 0000-0003-4439-047X
IdRef : 113655053

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

G. Regula

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Nathalie Mangelinck-Noël

Function : Author
PersonId : 17884
IdHAL : nathalie-mangelinck-noel
ORCID : 0000-0001-8570-6464
IdRef : 180364081

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

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Material chemistry

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Submitted on : Wednesday, February 1, 2017-5:14:58 PM

Last modification on : Monday, June 10, 2024-4:58:03 PM

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hal-01452264 , version 1 (01-02-2017)

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HAL Id : hal-01452264 , version 1

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M.G. Tsoutsouva, T. Riberi-Béridot, G. Reinhart, G. Regula, Nathalie Mangelinck-Noël. In situ Synchrotron X-ray Imaging of Extended Defects Generation and Evolution during Monocrystalline Si Seeded Growth. Silicon PV2016, Mar 2016, Chambéry, France. ⟨hal-01452264⟩

In situ Synchrotron X-ray Imaging of Extended Defects Generation and Evolution during Monocrystalline Si Seeded Growth

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