Conference Papers
Year : 2016
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https://amu.hal.science/hal-01452264
Submitted on : Wednesday, February 1, 2017-5:14:58 PM
Last modification on : Monday, June 10, 2024-4:58:03 PM
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- HAL Id : hal-01452264 , version 1
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M.G. Tsoutsouva, T. Riberi-Béridot, G. Reinhart, G. Regula, Nathalie Mangelinck-Noël. In situ Synchrotron X-ray Imaging of Extended Defects Generation and Evolution during Monocrystalline Si Seeded Growth. Silicon PV2016, Mar 2016, Chambéry, France. ⟨hal-01452264⟩
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