Investigation by in situ X-ray imaging of grain competition and defect formation during the growth of silicon for photovoltaic applications - Aix-Marseille Université
Communication Dans Un Congrès Année : 2016

Investigation by in situ X-ray imaging of grain competition and defect formation during the growth of silicon for photovoltaic applications

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https://amu.hal.science/hal-01452446

Soumis le : mercredi 1 février 2017-21:57:52

Dernière modification le : lundi 10 juin 2024-16:58:03

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hal-01452446 , version 1 (01-02-2017)

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  • HAL Id : hal-01452446 , version 1

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M.G. Tsoutsouva, T. Riberi-Béridot, G. Reinhart, G. Regula, J. Baruchel, et al.. Investigation by in situ X-ray imaging of grain competition and defect formation during the growth of silicon for photovoltaic applications . GDR SAM 2016, Dec 2016, Grenoble, France. ⟨hal-01452446⟩

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