In situ piezoelectric studies of PZT thin films by X-ray microdiffraction - Aix-Marseille Université Access content directly
Conference Papers Year : 2016
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hal-01453231 , version 1 (02-02-2017)

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  • HAL Id : hal-01453231 , version 1

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T. Cornelius, C. Mocuta, S. Escoubas, E.C. Lima, E.B. Araujo, et al.. In situ piezoelectric studies of PZT thin films by X-ray microdiffraction. 13th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP2016), Sep 2016, Brno, Czech Republic. ⟨hal-01453231⟩
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