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https://amu.hal.science/hal-01453338
Submitted on : Thursday, February 2, 2017-4:50:48 PM
Last modification on : Friday, March 24, 2023-2:53:03 PM
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- HAL Id : hal-01453338 , version 1
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A. Merabet, M. Texier, C. Tromas, M. Verdier, A. Talneau, et al.. HRTEM study of structural defects and related deformation mechanisms induced by nanocompression of silicon. European Microscopy Congress, Aug 2016, Lyon, France. ⟨hal-01453338⟩
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