Potentiality of Healing Techniques in Hot-Carrier Damaged 28nm FDSOI CMOS nodes - Aix-Marseille Université Access content directly
Conference Papers Year : 2016

Potentiality of Healing Techniques in Hot-Carrier Damaged 28nm FDSOI CMOS nodes

F. Cacho
  • Function : Author
X. Federspiel
  • Function : Author
C. Ndiaye
  • Function : Author
S. Mhira
  • Function : Author
V. Huard
  • Function : Author
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Dates and versions

hal-01463147 , version 1 (09-02-2017)

Identifiers

  • HAL Id : hal-01463147 , version 1

Cite

A. Bravaix, F. Cacho, X. Federspiel, C. Ndiaye, S. Mhira, et al.. Potentiality of Healing Techniques in Hot-Carrier Damaged 28nm FDSOI CMOS nodes. 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2016), Sep 2016, Halle, Germany. ⟨hal-01463147⟩
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