Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1D Case Applied to 28 nm FD-SOI Devices
Résumé
We present a 1D drift-diffusion solver for single-event simulation. Owing to its computational speed and circuit-coupling ability, the module is embedded in our soft error rate simulation platform, enabling projections on logic cells in 28 nm FD-SOI.
| Origine | Fichiers produits par l'(les) auteur(s) |
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