Structured Roughness of Si Surface Obtained by Molecular Beam Epitaxy on Highly Misoriented Si(111) Substrate - Aix-Marseille Université Access content directly
Journal Articles Surface Review and Letters Year : 1998

Structured Roughness of Si Surface Obtained by Molecular Beam Epitaxy on Highly Misoriented Si(111) Substrate

No file

Dates and versions

hal-01964075 , version 1 (21-12-2018)

Identifiers

  • HAL Id : hal-01964075 , version 1

Cite

J.-M. Gay, L. Lapena, M. Ladevèze, M. Tolan. Structured Roughness of Si Surface Obtained by Molecular Beam Epitaxy on Highly Misoriented Si(111) Substrate. Surface Review and Letters, 1998, 05 (01), pp.31-36. ⟨hal-01964075⟩
10 View
0 Download

Share

Gmail Facebook X LinkedIn More