Correction of secondary ion mass spectrometry profiles for atom diffusion measurements - Aix-Marseille Université Access content directly
Journal Articles Materials Letters Year : 2009
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hal-02044979 , version 1 (21-02-2019)

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  • HAL Id : hal-02044979 , version 1

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A. Portavoce, N. Rodriguez, Rachid Daineche, C. Grosjean, Christophe Girardeaux. Correction of secondary ion mass spectrometry profiles for atom diffusion measurements. Materials Letters, 2009, 63 (8), pp.676-678. ⟨hal-02044979⟩
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