Journal Articles
Materials Letters
Year : 2009
Christophe Girardeaux : Connect in order to contact the contributor
https://amu.hal.science/hal-02044979
Submitted on : Thursday, February 21, 2019-5:04:18 PM
Last modification on : Monday, June 10, 2024-4:58:03 PM
Dates and versions
Identifiers
- HAL Id : hal-02044979 , version 1
Cite
A. Portavoce, N. Rodriguez, Rachid Daineche, C. Grosjean, Christophe Girardeaux. Correction of secondary ion mass spectrometry profiles for atom diffusion measurements. Materials Letters, 2009, 63 (8), pp.676-678. ⟨hal-02044979⟩
41
View
0
Download