How to measure accurately mass transport in thin films by AES - Aix-Marseille Université Access content directly
Journal Articles Surface and Interface Analysis Year : 2002
No file

Dates and versions

hal-02045033 , version 1 (21-02-2019)

Identifiers

  • HAL Id : hal-02045033 , version 1

Cite

Christophe Girardeaux, G. Clugnet, Z. Erdélyi, J. Nyéki, J. Bernardini, et al.. How to measure accurately mass transport in thin films by AES. Surface and Interface Analysis, 2002, 34 (1), pp.389-392. ⟨hal-02045033⟩
28 View
0 Download

Share

Gmail Facebook X LinkedIn More