Real-Time Soft-Error Rate Characterization of Advanced SRAMs - Aix-Marseille Université Access content directly
Book Sections Year : 2010
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hal-02121292 , version 1 (06-05-2019)

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  • HAL Id : hal-02121292 , version 1

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Jean-Luc Autran, Daniela Munteanu, Sebastien Sauze, Philippe Roche, Gilles Gasiot. Real-Time Soft-Error Rate Characterization of Advanced SRAMs. K. Iniewski. Radiation Effects in Semiconductors, CRC Press, pp.225-247, 2010, 978-1-4398-2694-2. ⟨hal-02121292⟩
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