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Year : 2010
Daniela Munteanu : Connect in order to contact the contributor
https://amu.hal.science/hal-02121292
Submitted on : Monday, May 6, 2019-2:50:31 PM
Last modification on : Friday, March 24, 2023-2:53:10 PM
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- HAL Id : hal-02121292 , version 1
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Jean-Luc Autran, Daniela Munteanu, Sebastien Sauze, Philippe Roche, Gilles Gasiot. Real-Time Soft-Error Rate Characterization of Advanced SRAMs. K. Iniewski. Radiation Effects in Semiconductors, CRC Press, pp.225-247, 2010, 978-1-4398-2694-2. ⟨hal-02121292⟩
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