Journal Articles
Microscopy and Microanalysis
Year : 2019
Alain Portavoce : Connect in order to contact the contributor
https://amu.hal.science/hal-02381654
Submitted on : Tuesday, November 26, 2019-5:06:06 PM
Last modification on : Friday, March 24, 2023-2:53:14 PM
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Alain Portavoce, Khalid Hoummada, Lee Chow. Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements. Microscopy and Microanalysis, 2019, 25 (02), pp.517-523. ⟨10.1017/S1431927618015623⟩. ⟨hal-02381654⟩
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