Correction of secondary ion mass spectrometry profiles for atom diffusion measurements - Aix-Marseille Université Access content directly
Journal Articles Materials Letters Year : 2009

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hal-02386139 , version 1 (29-11-2019)

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A. Portavoce, N. Rodriguez, R. Daineche, C. Grosjean, C. Girardeaux. Correction of secondary ion mass spectrometry profiles for atom diffusion measurements. Materials Letters, 2009, 63 (8), pp.676-678. ⟨10.1016/j.matlet.2008.12.018⟩. ⟨hal-02386139⟩
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