Journal Articles
Microelectronics Reliability
Year : 2007
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https://amu.hal.science/hal-02386183
Submitted on : Friday, November 29, 2019-11:13:42 AM
Last modification on : Wednesday, August 2, 2023-4:40:25 PM
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- HAL Id : hal-02386183 , version 1
- DOI : 10.1016/j.microrel.2007.07.091
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J. Adrian, N. Rodriguez, F. Essely, G. Haller, C. Grosjean, et al.. Investigation of a new method for dopant characterization. Microelectronics Reliability, 2007, 47 (9-11), pp.1599-1603. ⟨10.1016/j.microrel.2007.07.091⟩. ⟨hal-02386183⟩
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