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Journal Articles Review of Scientific Instruments Year : 1999

Minority carrier lifetime scan map in crystalline silicon wafers

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hal-03350329 , version 1 (21-09-2021)

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J. Gervais, O. Palais, L. Clerc, S. Martinuzzi. Minority carrier lifetime scan map in crystalline silicon wafers. Review of Scientific Instruments, 1999, 70 (10), pp.4044-4046. ⟨10.1063/1.1150032⟩. ⟨hal-03350329⟩
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