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Journal Articles Applied Surface Science Year : 2022

Local defect-free elastic strain relaxation of Si1-xGex embedded into SiO2

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hal-03812512 , version 1 (19-10-2022)

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Elie Assaf, Isabelle Berbezier, Mohammed Bouabdellaoui, Marco Abbarchi, Antoine Ronda, et al.. Local defect-free elastic strain relaxation of Si1-xGex embedded into SiO2. Applied Surface Science, 2022, 590, pp.153015. ⟨10.1016/j.apsusc.2022.153015⟩. ⟨hal-03812512⟩
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