Strain and Lattice Orientation Mapping using Advanced X-ray Nano-Diffraction - Aix-Marseille Université Access content directly
Conference Papers Year : 2016

Strain and Lattice Orientation Mapping using Advanced X-ray Nano-Diffraction

No file

Dates and versions

hal-01452740 , version 1 (02-02-2017)

Identifiers

  • HAL Id : hal-01452740 , version 1

Cite

O. Thomas. Strain and Lattice Orientation Mapping using Advanced X-ray Nano-Diffraction. 14th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics–Experiment and Simulation, May 2016, Dresden, Germany. ⟨hal-01452740⟩
38 View
0 Download

Share

Gmail Facebook X LinkedIn More