From global and local Ge integration approaches on Si(001): Novel insights by advanced synchrotron-based scanning XRD - Aix-Marseille Université Access content directly
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From global and local Ge integration approaches on Si(001): Novel insights by advanced synchrotron-based scanning XRD

M. H. Zoellner
  • Function : Author
G. Chahine
  • Function : Author
P. Zaumseil
  • Function : Author
C. Reich
  • Function : Author
M. Häberlen
  • Function : Author
G. Capellini
  • Function : Author
F. Montalenti
  • Function : Author
A. Marzegalli
  • Function : Author
P. Storck
  • Function : Author
T. U. Schülli
  • Function : Author
T. Schroeder
  • Function : Author
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Dates and versions

hal-01453093 , version 1 (02-02-2017)

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  • HAL Id : hal-01453093 , version 1

Cite

M. H. Zoellner, G. Chahine, M.I. Richard, P. Zaumseil, C. Reich, et al.. From global and local Ge integration approaches on Si(001): Novel insights by advanced synchrotron-based scanning XRD. 13th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP2016), Sep 2016, Brno, Czech Republic. ⟨hal-01453093⟩
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