Conference Papers
Year : 2016
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https://amu.hal.science/hal-01453093
Submitted on : Thursday, February 2, 2017-3:32:47 PM
Last modification on : Tuesday, December 5, 2023-6:08:07 PM
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- HAL Id : hal-01453093 , version 1
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M. H. Zoellner, G. Chahine, M.I. Richard, P. Zaumseil, C. Reich, et al.. From global and local Ge integration approaches on Si(001): Novel insights by advanced synchrotron-based scanning XRD. 13th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP2016), Sep 2016, Brno, Czech Republic. ⟨hal-01453093⟩
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