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Conference Papers Year : 2016

Natural radiation events in CCD imager at ground level

Abstract

In Charged Coupled Devices (CCDs), radiation-induced events generate electron-holes pairs in silicon that cause artefacts and contribute to degrade image quality. In this work, the impact of natural radiation at ground level has been characterized at sea level, in altitude and underground for a commercial full-frame CCD device. Results have been carefully analysed in terms of event shape, size and hourly rates. The respective contributions of atmospheric radiation and telluric contamination from ultra-traces of alpha-particle emitters have been successfully separated and quantified. Experimental results have been compared with simulation results obtained from a dedicated radiation transport and interaction code.
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Dates and versions

hal-01456909 , version 1 (15-04-2019)

Identifiers

  • HAL Id : hal-01456909 , version 1

Cite

T. Saad Saoud, S. Moindjie, Daniela Munteanu, Jean-Luc Autran. Natural radiation events in CCD imager at ground level. 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Sep 2016, Halle, Germany. ⟨hal-01456909⟩
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