Study of the microstructure and stress induced during the crystallization of GeTe thin films - Aix-Marseille Université Access content directly
Conference Papers Year : 2017

Study of the microstructure and stress induced during the crystallization of GeTe thin films

M. Gallard
  • Function : Author
M.S. Amara
  • Function : Author
F. Lauraux
  • Function : Author
C. Guichet
  • Function : Author
C. Mocuta
P. Noé
  • Function : Author
C. Sabbione
  • Function : Author
F. Hippert
N. Burle
  • Function : Author
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Dates and versions

hal-01781812 , version 1 (30-04-2018)

Identifiers

  • HAL Id : hal-01781812 , version 1

Cite

M. Gallard, M.S. Amara, F. Lauraux, C. Guichet, S. Escoubas, et al.. Study of the microstructure and stress induced during the crystallization of GeTe thin films. E/PCOS 2017, European Phase Change and Ovonics Symposium, Sep 2017, Aachen, Germany. ⟨hal-01781812⟩
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