Dynamic segregation of metallic impurities at SiO 2 /Si interfaces - Aix-Marseille Université Access content directly
Journal Articles Journal of Physics: Conference Series Year : 2013

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hal-02385357 , version 1 (28-11-2019)

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A. de Luca, A. Portavoce, M. Texier, N. Burle, B Pichaud. Dynamic segregation of metallic impurities at SiO 2 /Si interfaces. Journal of Physics: Conference Series, 2013, 471, pp.012029. ⟨10.1088/1742-6596/471/1/012029⟩. ⟨hal-02385357⟩
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