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Article Dans Une Revue Materials Science and Engineering: B Année : 2002

Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers

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hal-03350311 , version 1 (21-09-2021)

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O. Palais, E. Yakimov, S. Martinuzzi. Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers. Materials Science and Engineering: B, 2002, 91-92, pp.216-219. ⟨10.1016/S0921-5107(01)00998-9⟩. ⟨hal-03350311⟩
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