Journal Articles
Materials Science and Engineering: B
Year : 2002
Olivier Palais : Connect in order to contact the contributor
https://amu.hal.science/hal-03350311
Submitted on : Tuesday, September 21, 2021-11:17:25 AM
Last modification on : Friday, September 15, 2023-10:38:30 AM
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- HAL Id : hal-03350311 , version 1
- DOI : 10.1016/S0921-5107(01)00998-9
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O. Palais, E. Yakimov, S. Martinuzzi. Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers. Materials Science and Engineering: B, 2002, 91-92, pp.216-219. ⟨10.1016/S0921-5107(01)00998-9⟩. ⟨hal-03350311⟩
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