Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers - Aix-Marseille Université Access content directly
Journal Articles Materials Science and Engineering: B Year : 2002

Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers

Dates and versions

hal-03350311 , version 1 (21-09-2021)

Identifiers

Cite

O. Palais, E. Yakimov, S. Martinuzzi. Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers. Materials Science and Engineering: B, 2002, 91-92, pp.216-219. ⟨10.1016/S0921-5107(01)00998-9⟩. ⟨hal-03350311⟩
21 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More